INSERT, TEST TRAY AND SEMICONDUCTOR TESTING APPARATUS

摘要

Disclosed is an insert for housing a semiconductor device (100) under test in a semiconductor testing apparatus. This insert comprises a frame portion (520), an IC housing portion (530) for supporting the semiconductor device (100) under test, a coupling portion for coupling the frame portion (520) and the IC housing portion (530) with each other in such a manner that the relational positions of the frame portion (520) and the IC housing portion (530) can be changed, and a guiding portion for guiding the IC housing portion (530) to a certain position relative to the frame portion (520) within a specific period of time.