发明名称 THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a 3-dimensional measurement device and method for the same, capable of precisely measuring the 3-dimensional shape of a measuring object. SOLUTION: A pair of probes 20a and 20b are arranged such that their tips face in a line form with prescribed interval. The surface and the rear face of the measurement object 1 are positioned so as to face a pair of probes, respectively. After that, the relative position of the measurement object 1 between the pair of probes is moved with sliding, without changing the mutual positional relation of the pair of probes 20a and 20b. The 3-dimensional shape of the surface of the object 1 is measured by either probe, then the 3-dimensional shape of the rear face of the object 1 is measured by the other probe. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006343255(A) 申请公布日期 2006.12.21
申请号 JP20050170422 申请日期 2005.06.10
申请人 OLYMPUS CORP 发明人 KOBAYASHI HIROSHI
分类号 G01B21/20 主分类号 G01B21/20
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