发明名称 EVALUATION METHOD OF CONTACT INTERFACE AREA, AND EVALUATION DEVICE OF CONTACT INTERFACE AREA
摘要 <p><P>PROBLEM TO BE SOLVED: To evaluate a contact interface area between solid objects in a molecular level. <P>SOLUTION: The contact interface area between at least two kinds of the first solid object and the second solid object having each different photorefractive index is evaluated by using an optical waveguide spectroscopy utilizing an evanescent wave generated on the contact interface between the first solid object used as an optical waveguide and the second solid object in contact with the first solid object. When incident light is totally reflected by the contact interface between the first solid object and the second solid object, an evanescent wave absorbing material or a material generating specific light by absorbing the evanescent wave is added to the second solid object, and the intensity of outgoing light is detected, to thereby evaluate the contact interface area between the first solid object and the second solid object. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006266839(A) 申请公布日期 2006.10.05
申请号 JP20050084676 申请日期 2005.03.23
申请人 SUMITOMO RUBBER IND LTD 发明人 TADA TOSHIO;NISHIOKA KAZUYUKI
分类号 G01N19/04;G01N21/27;G01N21/64 主分类号 G01N19/04
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