发明名称 Semiconductor device, method of manufacturing the same, and substrate for manufacturing the same
摘要 A semiconductor device includes a substrate, a buffer layer that is formed with an aluminum nitride layer on the substrate and has a film thickness of 5 nm to 40 nm, an operating layer that is formed with a gallium nitride-based semiconductor on the buffer layer, and a control electrode that is formed on the operating layer.
申请公布号 US2006220039(A1) 申请公布日期 2006.10.05
申请号 US20060391288 申请日期 2006.03.29
申请人 FUJITSU LIMITED 发明人 YOKOYAMA MITSUNORI;IMANISHI KENJI;KIKKAWA TOSHIHIDE
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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