发明名称 System and method for display test
摘要 The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test pads is less than the number of the IC pads.
申请公布号 US2006192585(A1) 申请公布日期 2006.08.31
申请号 US20050228644 申请日期 2005.09.15
申请人 AU OPTRONICS CORPORATION 发明人 CHEN CHANG-YU;HSIEH KUAN-YUN;YU JIAN-SHEN;CHEN YI-PING
分类号 G01R31/00 主分类号 G01R31/00
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