发明名称 |
Semiconductor device and method of fabricating the same |
摘要 |
A semiconductor device has an element isolating region formed of an insulating film having etching rates different from each other in a side close to an inside wall and a center side of a trench formed on a semiconductor substrate, and a selective epitaxial layer formed in both sides of the element isolating region, wherein the element isolating region has a tip portion in a tapered shape or a stepwise shape of which a width becomes narrower at a side closer to the tip portion.
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申请公布号 |
US2006194405(A1) |
申请公布日期 |
2006.08.31 |
申请号 |
US20050266262 |
申请日期 |
2005.11.04 |
申请人 |
NAGANO HAJIME;MIYANO KIYOTAKA;ARISUMI OSAMU |
发明人 |
NAGANO HAJIME;MIYANO KIYOTAKA;ARISUMI OSAMU |
分类号 |
H01L21/76;H01L29/00 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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