发明名称 SOI SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an SOI semiconductor device wherein a kink effect is suppressed and a cost concerning a design is cheap, and to provide a method of manufacturing the SOI semiconductor device. SOLUTION: An SOI-MOSFET device 1 is provided with a gate electrode 9 formed through a gate insulating film 8 on a silicon thin film of an SOI substrate consisting of a support substrate 2, a buried oxide film 3 formed on the support substrate 2, and the silicon thin film formed on the buried oxide film 3; a channel region 7 located under the gate electrode 9 in the silicon thin film; a pair of n<SP>+</SP>diffusion areas 6 formed on the silicon thin film so as to pinch the channel region 7; and a p<SP>+</SP>diffusion area 14 which has the same conductive type as the channel region 7 and adjoins one of a pair of the n<SP>+</SP>diffusion areas 6 in the silicon thin film, and is formed in a region contacted with the channel region 7. Moreover, there is provided an insulating region 13 in a region which parts the channel region 7 in the gate widthwise direction. An electric charge built up in the channel region 7 is drawn out from a contact 10 through the p<SP>+</SP>diffusion area 14. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006156862(A) 申请公布日期 2006.06.15
申请号 JP20040348198 申请日期 2004.12.01
申请人 OKI ELECTRIC IND CO LTD 发明人 CHIBA TADASHI
分类号 H01L29/786;H01L21/28;H01L21/8234;H01L27/08;H01L27/088;H01L29/417 主分类号 H01L29/786
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