发明名称 SURFACE POTENTIAL MEASURING METHOD AND SURFACE POTENTIAL METER
摘要 PROBLEM TO BE SOLVED: To provide a method and the like for realizing easy measurement of surface potential. SOLUTION: The surface potential measuring method includes arranging a first fixed electrode apart from the surface to be measured; arranging a second fixed electrode apart from the surface to be measured and closer to the surface to be measured than the first fixed electrode; connecting one end of the first capacitor to the first fixed electrode and the other end of the first capacitor to a reference potential line; connecting one end of the second capacitor to the second fixed electrode and the other end of the first capacitor to a reference potential line; detecting of the inter-terminal voltage of the first capacitor and the inter-terminal voltage of the second capacitor; and calculating a voltage value corresponding to the potential of the surface to be measured, by applying a predetermined operation equation to the detected inter-terminal voltage of the first capacitor and the inter-terminal voltage of the second capacitor. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006153631(A) 申请公布日期 2006.06.15
申请号 JP20040344012 申请日期 2004.11.29
申请人 HOKUTO DENSHI KOGYO KK 发明人 NAKANO KOICHI;ASAI YOSHIHITO
分类号 G01R29/12;G01R29/24 主分类号 G01R29/12
代理机构 代理人
主权项
地址