| 摘要 |
The device for detecting surface defects on the outer wall ( 2 ) of a transparent or translucent object ( 3 ), comprises: a broad light source ( 4 ), adapted to send a light beam ( 5 ) onto a surface of the wall ( 2 ), a linear sensor ( 8 ) for measuring light beams, arranged to collect the light beam ( 9 ) reflected by a linear zone of the wall ( 2 ), illuminated by the light source ( 4 ), means ( 12 ) ensuring relative movement between the object and the light source ( 4 ) and the linear measuring sensor ( 8 ), to move the linear measuring zone over the wall ( 2 ) of the object to cover the surface to be inspected, and a unit ( 15 ) for analysing and processing the light beams, received by the measuring sensor ( 8 ), for creating an image and to identify within the image the presence of a surface defect corresponding to a dark area.
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