发明名称 High-power pulsed magnetically enhanced plasma processing
摘要 Magnetically enhanced plasma processing methods and apparatus are described. A magnetically enhanced plasma processing apparatus according to the present invention includes an anode and a cathode that is positioned adjacent to the anode. An ionization source generates a weakly-ionized plasma proximate to the cathode. A magnet is positioned to generate a magnetic field proximate to the weakly-ionized plasma. The magnetic field substantially traps electrons in the weakly-ionized plasma proximate to the cathode. A power supply produces an electric field in a gap between the anode and the cathode. The electric field generates excited atoms in the weakly-ionized plasma and generates secondary electrons from the cathode. The secondary electrons ionize the excited atoms, thereby creating a strongly-ionized plasma. A voltage supply applies a bias voltage to a substrate that is positioned proximate to the cathode that causes ions in the plurality of ions to impact a surface of the substrate in a manner that causes etching of the surface of the substrate
申请公布号 US2005167263(A1) 申请公布日期 2005.08.04
申请号 US20050091854 申请日期 2005.03.28
申请人 CHISTYAKOV ROMAN 发明人 CHISTYAKOV ROMAN
分类号 H01J37/32;(IPC1-7):C23C14/34 主分类号 H01J37/32
代理机构 代理人
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