发明名称 A MEASUREMENT TO DETERMINE PLASMA LEAKAGE
摘要 Disclosed is a method and system for detecting abnormal plasma discharge that is useful in, for example, detecting plasma leakage in a reactive ion etching (RIE) chamber. The system includes electrical contacts connected to the chamber that provide an input signal to the chamber. This input signal can be generated by a radio frequency (RF) generator that is connected to the electrical contacts. A variable power controller connected to the RF generator gradually increases (ramps) the power of the input signal being supplied to the chamber.
申请公布号 US2005167396(A1) 申请公布日期 2005.08.04
申请号 US20040708009 申请日期 2004.02.02
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CALDERONI ROBERT A.;CLINE JUNE;DUTRA KELLIE L.;MEUNIER RONALD G.;WALKO JOSEPH P.;WONG JUSTIN W.
分类号 G01L21/30;G01M3/40;G01R31/00;H01J37/32;(IPC1-7):G01L21/30 主分类号 G01L21/30
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