发明名称 |
Sample preparation method for transmission electron microscopy in which material is first removed from a sample using ultra-short pulse laser ablation under vacuum and then inert gas ions are fired at the remaining thin bar |
摘要 |
<p>Method for preparing material samples for transmission electron microscopy in which material is removed from the samples using ultra-short pulse laser ablation within a vacuum chamber. The resulting remaining narrow bar is then processed using inert gas ions so that the bar becomes transparent to electrons.</p> |
申请公布号 |
DE102004001173(A1) |
申请公布日期 |
2005.08.04 |
申请号 |
DE20041001173 |
申请日期 |
2004.01.05 |
申请人 |
3D-MICROMAC AG |
发明人 |
HOECHE, THOMAS;HAENEL, JENS;PETSCH, TINO |
分类号 |
G01N1/28;G01N1/44;G01N23/04;G01N23/22;(IPC1-7):G01N1/28 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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