发明名称 SCREENING OF INTEGRATED CIRCUIT
摘要 PURPOSE:To facilitate the screening of even a circuit block having no external terminal, by a method wherein a signal is applied from an input terminal to ascertain the continuity or non-continuity of an internal transistor (Tr) and with the confirmation thereof, a high voltage pulse is applied between power source terminals. CONSTITUTION:It is so arranged that the continuity or non-continuity of an NPN-Tr1 and PNP-Tr2 can be selected depending on the selection of a potential of an input terminal. When a high voltage pulse is applied to a high voltage side power source terminal (a) with the continuity of the Tr1 and the non- continuity of the Tr2, a high voltage works between the base/emitter line of the Tr1 and a low voltage side power source line and on the base line of the Tr2 and on a high voltage side power source line to allow the screening. Conversely, when with the non-continuity of the Tr1 and the continuity of the Tr2, a high voltage pulse is applied to the terminal (a), a high voltage works on the base line of the Tr1 and on the low voltage power source line and between the base/emitter line of the Tr2 and the high voltage power source line to allow the screening.
申请公布号 JPS63151877(A) 申请公布日期 1988.06.24
申请号 JP19860300768 申请日期 1986.12.16
申请人 NEC CORP 发明人 FUJI TAKASHI
分类号 H01L21/66;G01R31/30 主分类号 H01L21/66
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