发明名称 Multi-angle light scattering
摘要 The multi-angle light scattering device has a measuring cell for receiving the substance to be measured, which is irradiated by a primary beam. The scattered secondary beams are detected via detectors and evaluated in an evaluation unit. To reduce the signal/noise ratio, the secondary beam paths are formed, at least in part, by optical waveguides. This device enables very exact light scattering measurement with a very good signal/noise ratio, so that the measuring times necessary can be considerably reduced.
申请公布号 DE3813718(A1) 申请公布日期 1989.11.02
申请号 DE19883813718 申请日期 1988.04.22
申请人 MAX PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN EV, 8000 MUENCHEN, DE 发明人 BECKER, ALFONS, 6541 MAINZ, DE;SCHMIDT, MANFRED, DIPL.-CHEM., 7809 DENZLINGEN, DE
分类号 G01N21/51 主分类号 G01N21/51
代理机构 代理人
主权项
地址