| 发明名称 |
Method and circuit configuration of the parallel input of data into a semiconductor memory |
| 摘要 |
A method and circuit configuration for the parallel input of data items in the form of a test pattern into a block of a semiconductor memory having a plurality of storage cells. For test purposes, data items are simultaneously input in parallel into the storage cells.
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| 申请公布号 |
US4885748(A) |
申请公布日期 |
1989.12.05 |
| 申请号 |
US19880168668 |
申请日期 |
1988.03.16 |
| 申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
HOFFMANN, KURT;OBERLE, HANS-DIETER;KRAUS, RAINER;KOWARIK, OSKAR;PAUL, MANFRED |
| 分类号 |
G11C29/00;G11C11/401;G11C29/34 |
主分类号 |
G11C29/00 |
| 代理机构 |
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