发明名称 INTEGRATED CIRCUIT DEVICE
摘要 <p>PURPOSE:To prevent cracks from occurring in a protective glass and to improve it in reliability by a method wherein an upper conductor and a lower conductor are made to have a specified positional relation between them. CONSTITUTION:A side 4a of an upper conductor pattern 4 which is electrically connected with a resistor 5 is made to deviate from a side 2a of a lower conductor pattern 2 closest to the resistor 5 by a distance (d) of 300mum or more in a planar direction. By this setup, the conductors 2 and 4 and a protective glass 6 are made to expand as shown by broken lines respectively in a burning process of the protective glass 6 and then shrink as shown by continuous lines respectively, and a tensile stress acts on them each. A large tensile stress acts on the right side of the side 4a and on the other hand the left side is hardly affected by a tensile stress. As the side 2a is so set as to deviate positionally from the side 4a by a distance of 300mum or more, the tensile stress of the conductor 2 can be absorbed enough by an interlaminar insulating film 3 and the ununiformity of the stress can be alleviated, so that a protective glass can be free from cracks and an integrated circuit device of this design high in reliability can be obtained.</p>
申请公布号 JPH02132882(A) 申请公布日期 1990.05.22
申请号 JP19880286461 申请日期 1988.11.11
申请人 NIPPON DENSO CO LTD 发明人 NAGASAKA TAKASHI;OTANI YUJI;NINOMIYA TAKESHI
分类号 H05K3/28;H05K3/46 主分类号 H05K3/28
代理机构 代理人
主权项
地址