发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To make it possible to arrange MOS transistors in the close proximity and to improve the integration density of a device by forming the base electrode of a bipolar transistor in the same step at either of the step for foming P-type or N-type polycrystalline silicon layer. CONSTITUTION:The following steps are provided: the step for forming the gate electrode of one MOS transistor Q1 with a P-type polycrystalline silicon layer 9; the step for covering the side surface of the P-type polycrystalline silicon layer 8 with an insulating film 12; and the step for forming the gate electrode of another MOS transistor Q2 with an N-type polycrystalline silicon layer 10. A base electrode B of a bipolar transistor is formed in the same step as the step for forming either of the P-type polycrystalline silicon layer 9 or the N-type polycrystalline silicon layer. Thus, the high integration density of the device can be achieved without increasing the manufacturing steps.
申请公布号 JPH02246264(A) 申请公布日期 1990.10.02
申请号 JP19890067985 申请日期 1989.03.20
申请人 HITACHI LTD 发明人 MINAMI MASATAKA;SATO KAZUE;WATANABE TOKUO;YADORI SHOJI;NISHIDA TAKASHI;NAGANO TAKAHIRO
分类号 H01L21/8249;H01L27/06;H01L27/11 主分类号 H01L21/8249
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