发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To make it possible to arrange MOS transistors in the close proximity and to improve the integration density of a device by forming the base electrode of a bipolar transistor in the same step at either of the step for foming P-type or N-type polycrystalline silicon layer. CONSTITUTION:The following steps are provided: the step for forming the gate electrode of one MOS transistor Q1 with a P-type polycrystalline silicon layer 9; the step for covering the side surface of the P-type polycrystalline silicon layer 8 with an insulating film 12; and the step for forming the gate electrode of another MOS transistor Q2 with an N-type polycrystalline silicon layer 10. A base electrode B of a bipolar transistor is formed in the same step as the step for forming either of the P-type polycrystalline silicon layer 9 or the N-type polycrystalline silicon layer. Thus, the high integration density of the device can be achieved without increasing the manufacturing steps.
|
申请公布号 |
JPH02246264(A) |
申请公布日期 |
1990.10.02 |
申请号 |
JP19890067985 |
申请日期 |
1989.03.20 |
申请人 |
HITACHI LTD |
发明人 |
MINAMI MASATAKA;SATO KAZUE;WATANABE TOKUO;YADORI SHOJI;NISHIDA TAKASHI;NAGANO TAKAHIRO |
分类号 |
H01L21/8249;H01L27/06;H01L27/11 |
主分类号 |
H01L21/8249 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|