发明名称 FORMING METHOD OF MULTI-LAYER WIRING
摘要 The method forms the multi-layer wiring with an etchback flatting technique. The method includes the processes of: forming the 1st wiring layer on the middle insulating layer; burying a layering insulation in the 1st wiring layer, forming an opening in a sacrificing layer, forming a contact-hole in the layering insulation by the etchback, forming the multi-wiring of Al or Al alloy by the edge-slope in the contact-hole, by the plasma-etching method.
申请公布号 KR930008869(B1) 申请公布日期 1993.09.16
申请号 KR19910006585 申请日期 1991.04.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG, WON - SOK
分类号 H01L21/3205;H01L23/522;(IPC1-7):H01L23/522;H01L21/320 主分类号 H01L21/3205
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