发明名称 MANUFACTURING METHOD OF ALIGNED NANOWIRE AND ELEMENT APPLICATION
摘要 <p>A method for manufacturing aligned nanowire is provided to control the size of nanowire on the nanometer level easily and conveniently, thereby realizing mass production or high integration of application elements of the nanowire. A method for manufacturing aligned nanowire comprises the following steps of: depositing an insulating layer(2) on a substrate(1); depositing an etch preventive layer(3) on the insulating layer; depositing a sacrificial layer(4) on the etch preventive layer; partially etching the sacrificial layer in order to form a pattern for the formation of nanowire; depositing a semiconductor thin film or a metal thin film(5) on the sacrificial layer and the etch preventive layer which is exposed by the partial etching such that a horizontal and vertical layer of the semiconductor thin film or the metal thin film have uniform thickness; removing the horizontal layer; and removing the remaining sacrificial layer so as to form a semiconductor nanowire.</p>
申请公布号 KR20090093081(A) 申请公布日期 2009.09.02
申请号 KR20080018410 申请日期 2008.02.28
申请人 INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY 发明人 IM, YEON HO;RA, HYUN WOOK;CHOI, KWANG SUNG
分类号 B82B3/00;H01L21/027 主分类号 B82B3/00
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