发明名称 Lithographic apparatus and semiconductor device manufacturing method
摘要 <p>In a lithographic apparatus, a feedforward transfer function of a control system, is determined by : a) iteratively learning a feedforward output signal of the control system by iterative learning control for a given setpoint signal; b) determining a relation between the learned feedforward output signal and the setpoint signal; and c) applying the relation as the feedforward transfer function of the control system. A learned feedforward, which has been learned for one or more specific setpoint signals only, can be adapted to provide a setpoint signal dependent feedforward output signal. The learned feedforward can be made more robust against setpoint variations. </p>
申请公布号 EP1962157(A3) 申请公布日期 2009.09.02
申请号 EP20080075116 申请日期 2008.02.13
申请人 ASML NETHERLANDS BV 发明人 HEERTJES, MARCEL FRANCOIS;TSO, YIN-TIM;KAMIDI, RAMIDIN IZAIR;BAGGEN, MARK CONSTANT JOHANNES;BAGGEN, CONSTANT PAUL MARIE JOZEF;VAN DE MOLENGRAFT, MARINUS JACOBUS GERERDUS
分类号 G05B13/02 主分类号 G05B13/02
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