发明名称 ONE TRANSISTOR DRAM CELL STRUCTURE AND METHOD FOR FORMING
摘要 <p>A one-transistor dynamic random access memory (DRAM) cell includes a transistor (10) which has a first source/drain region (26) a second source/drain region (24), a body region (36) between the first and second source/drain regions, and a gate (28) over the body region. The first source/drain region includes a Schottky diode junction with the body region and the second source/drain region includes an n-p diode junction with the body region.</p>
申请公布号 KR20090093938(A) 申请公布日期 2009.09.02
申请号 KR20097009009 申请日期 2007.08.30
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 BURNETT JAMES D.;WINSTEAD BRIAN A.
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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