发明名称 Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit
摘要 An electronic circuit comprises a plurality of configurable cells configured according to a chaining command signal. These configurable cells are configured either in a chained state in which the configurable cells are functionally connected in a chain to form a shift register, if the chaining command signal is in a first state, or in a functional state in which the configurable cells are functionally linked to logic cells with which they co-operate to form at least one logic circuit, if the mode command signal is in a second state. It is provided that a test data word will be preceded by a signature. The set formed by the digital signature and the data word forms a test sequence. The signature is verified before the introduction of the test data word by an appropriate detection circuit.
申请公布号 US7577886(B2) 申请公布日期 2009.08.18
申请号 US20060484355 申请日期 2006.07.10
申请人 STMICROELECTRONICS, SA 发明人 BANCEL FREDERIC;HELY DAVID
分类号 G01R31/28 主分类号 G01R31/28
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