发明名称 MICRO CHIP INSPECTION SYSTEM
摘要 An apparatus for inspecting a chip is provided to improve accuracy of inspection by imaging all surfaces of a microchip through six vision cameras. A chip supply part supplies a microchip to a chip array part. The chip array part guides the microchip to a top part of a rotary unit. The rotary unit includes a glass ring(310) and a rotary drive. The microchip is mounted in the glass ring. The rotary drive is rotated by a motor. An edge part of the rotary drive is higher than a central part. The glass ring is fixed to the edge part of the rotary drive. A vision camera part images all surfaces of the microchip. A product detection sensor detects position information of the microchip mounted in the glass ring. A product sorter(500) collects the microchip which is separated from the glass ring. A control part determines a defect of the microchip based on the image information received from the vision camera part.
申请公布号 KR20090087616(A) 申请公布日期 2009.08.18
申请号 KR20080012960 申请日期 2008.02.13
申请人 T2MINC CO., LTD.;DISSEM CO., LTD. 发明人 CHUNG, SUNG WON;LEE, JEONG SUB;CHO, SUNG CHIL;LEE, YU HYONG
分类号 H05K13/08 主分类号 H05K13/08
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