发明名称 Fin structure and method of manufacturing fin transistor adopting the fin structure
摘要 Provided are a fin structure and a method of manufacturing a fin transistor adopting the fin structure. A plurality of mesa structures including sidewalls are formed on the substrate. A semiconductor layer is formed on the mesa structures. A capping layer is formed on the semiconductor layer. Thus, the semiconductor layer is protected by the capping layer and includes a portion which is to be formed as a fin structure. A portion of an upper portion of the capping layer is removed by planarizing, and thus a portion of the semiconductor layer on upper surfaces of the mesa structures is removed. As a result, fin structures are formed on sides of the mesa structures to be isolated from one another. Therefore, a fin structure having a very narrow width can be formed, and a thickness and a location of the fin structure can be easily controlled.
申请公布号 US7575962(B2) 申请公布日期 2009.08.18
申请号 US20070826420 申请日期 2007.07.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO HANS S.;PARK YOUNG-SOO;XIANYU WENXU
分类号 H01L21/00;H01L21/84 主分类号 H01L21/00
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