| 摘要 |
An LCD device having test architecture includes a plurality of data lines, a plurality of gate lines, a plurality of common lines, and a plurality of rows of pixel units. The odd and even common lines are utilized for furnishing a first common voltage and a second common voltage, respectively. The odd and even rows of pixel units are coupled to corresponding odd and even common lines, respectively. Furthermore, disclosed is a test method for detecting defects of the LCD device. The test method includes enabling all the gate lines and furnishing a first test voltage to a corresponding data line during a first interval, disabling even gate lines and furnishing a second test voltage to the corresponding data line during a second interval, and switching the second common voltage from a first common test voltage to a second common test voltage during a third interval.
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