发明名称 |
SLURRY COMPOSITION FOR CHEMICAL MECHANICAL POLISHING AND PROCESS OF CHEMICAL MECHANICAL POLISHING |
摘要 |
A slurry composition for chemical mechanical polishing is provided to remarkably improve selectivity with SiN. A slurry composition for chemical mechanical polishing comprises abrasive 0.01-1 weight% which is metal oxide, an oxidizing agnet 0.5-5 weight%, a first polishing inhibitor 0.001-10 weight%, a second polishing inhibitor 0.001-10 weight%, a dispersing stabilizer 0.001-10 weight% and solvent of remaining amount. The first polishing inhibitor is phosphate consisting of at least one phosphate group(PO_4^3-) or monohydrogen phosphate group(HPO_4^2-). The second polishing inhibitor is C2-10 hydrocarbon compound consisting of a sulfone group(-SO3H) and a sulfonate group(-OSO3H).
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申请公布号 |
KR20090087268(A) |
申请公布日期 |
2009.08.17 |
申请号 |
KR20080012611 |
申请日期 |
2008.02.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG WON;HONG, CHANG KI;HAN, SANG YEOB |
分类号 |
C09K3/14 |
主分类号 |
C09K3/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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