发明名称 SLURRY COMPOSITION FOR CHEMICAL MECHANICAL POLISHING AND PROCESS OF CHEMICAL MECHANICAL POLISHING
摘要 A slurry composition for chemical mechanical polishing is provided to remarkably improve selectivity with SiN. A slurry composition for chemical mechanical polishing comprises abrasive 0.01-1 weight% which is metal oxide, an oxidizing agnet 0.5-5 weight%, a first polishing inhibitor 0.001-10 weight%, a second polishing inhibitor 0.001-10 weight%, a dispersing stabilizer 0.001-10 weight% and solvent of remaining amount. The first polishing inhibitor is phosphate consisting of at least one phosphate group(PO_4^3-) or monohydrogen phosphate group(HPO_4^2-). The second polishing inhibitor is C2-10 hydrocarbon compound consisting of a sulfone group(-SO3H) and a sulfonate group(-OSO3H).
申请公布号 KR20090087268(A) 申请公布日期 2009.08.17
申请号 KR20080012611 申请日期 2008.02.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG WON;HONG, CHANG KI;HAN, SANG YEOB
分类号 C09K3/14 主分类号 C09K3/14
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