发明名称 |
RECESS GATE OF SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a recess gate and a method of manufacturing a semiconductor device including the same. SOLUTION: The recess gate of the semiconductor device includes a substrate 110, a metal layer 165, a polysilicon layer, and a source region and a drain region formed adjacent to the polysilicon layer and spaced from the metal layer 165. The method for manufacturing the semiconductor device includes steps of: forming a source/drain layer 120 on the substrate 110; forming a recess 112 to form a first conductive pattern 145; forming a second conductive layer on the first conductive layer pattern 145; forming a second conductive layer pattern 156 to overlap the source/drain layer 120; depositing an insulating layer on the second conductive layer pattern 156 and the source/drain layer 120; and planarizing the insulating layer to form a cap on the second conductive layer pattern 156. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009164612(A) |
申请公布日期 |
2009.07.23 |
申请号 |
JP20080335726 |
申请日期 |
2008.12.29 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
LEE SI-HYUNG;MIN-JI YOUNG;SAI JIEI;KANG SANG-BOM;HWANG HEEDON;WOO DONGSOO |
分类号 |
H01L29/78;H01L21/8234;H01L21/8238;H01L21/8242;H01L27/088;H01L27/092;H01L27/10;H01L27/108;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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