发明名称 RECESS GATE OF SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a recess gate and a method of manufacturing a semiconductor device including the same. SOLUTION: The recess gate of the semiconductor device includes a substrate 110, a metal layer 165, a polysilicon layer, and a source region and a drain region formed adjacent to the polysilicon layer and spaced from the metal layer 165. The method for manufacturing the semiconductor device includes steps of: forming a source/drain layer 120 on the substrate 110; forming a recess 112 to form a first conductive pattern 145; forming a second conductive layer on the first conductive layer pattern 145; forming a second conductive layer pattern 156 to overlap the source/drain layer 120; depositing an insulating layer on the second conductive layer pattern 156 and the source/drain layer 120; and planarizing the insulating layer to form a cap on the second conductive layer pattern 156. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009164612(A) 申请公布日期 2009.07.23
申请号 JP20080335726 申请日期 2008.12.29
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE SI-HYUNG;MIN-JI YOUNG;SAI JIEI;KANG SANG-BOM;HWANG HEEDON;WOO DONGSOO
分类号 H01L29/78;H01L21/8234;H01L21/8238;H01L21/8242;H01L27/088;H01L27/092;H01L27/10;H01L27/108;H01L29/423;H01L29/49 主分类号 H01L29/78
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