| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an apparatus for inspecting a solar cell and a method of determining defects of the solar cell that determine the quality of the solar cell from the emission state by causing the solar cell to emit EL light, and determine a solar cell having a risk of becoming defective in the future. <P>SOLUTION: A solar cell is made to emit EL light by supplying a constant current thereto (S7), light emitted from every cell is photoed (S10), a cell image thus photoed is enhanced and the shape of a dark part is analyzed (S50) thus determining the quality of the cell. At the same time, an image emphasizing a defective part determined to have a problem is displayed visibly (S16). <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
