DISPOSITIVO PARA LA MEDIDA DE CORRIENTE CRITICA EN ANILLOS SUPERCONDUCTORES UTILIZANDO UNA FUENTE DE CONTINUA COMO CONTROL.,申请号ES20040001790-传众专利搜索

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发明名称	DISPOSITIVO PARA LA MEDIDA DE CORRIENTE CRITICA EN ANILLOS SUPERCONDUCTORES UTILIZANDO UNA FUENTE DE CONTINUA COMO CONTROL.
摘要
申请公布号	ES2293759(B1)	申请公布日期	2009.07.23
申请号	ES20040001790	申请日期	2004.07.21
申请人	UNIVERSIDAD DE VIGO	发明人	GONZALEZ JORGE HIGINIO;DOMARCO ALVAREZ GERARDO;PELETEIRO SALGADO JOSE;GONZALEZ SALGADO DIEGO;TRONCOSO CASARES JACOBO ANTONIO;QUELLE VIDAL IRIA
分类号	H01F6/02;G01R19/08	主分类号	H01F6/02
代理机构		代理人
主权项
地址

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