| 摘要 |
<P>PROBLEM TO BE SOLVED: To estimate the degree of influence of a trouble caused by a defect of an electronic component, and carry out a fault diagnosis of the electronic component. <P>SOLUTION: A method for the fault diagnosis of the electronic component, capable of preliminarily checking the defect of a plurality of electronic components being not elicited is provided, which comprises: an analytic method deriving step 2 of deriving an analytic method for the electronic component; a defect part checking step 3 of checking the defect of the electronic component based on the derived analytic method; a fault history deriving step 5 of deriving history information of a fault caused by the defect; an influence degree estimating step 6 of estimating the degree of the trouble caused by the defect; and a defect factor estimating step 7 of estimating a cause of the defect. <P>COPYRIGHT: (C)2009,JPO&INPIT |
