发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent information written in a ferroelectric memory from being disappeared due to heating processing in a manufacturing process of the ferroelectric memory. <P>SOLUTION: A semiconductor memory device (10) provided with a ferroelectric memory (102) is provided with a nonvolatile memory (103) in which data holding capability under high temperature is higher than a ferroelectric memory (102), and a connection circuit (104) switching connection and non-connection of the ferroelectric memory (102) and the nonvolatile memory (103). The ferroelectric memory (102) receives at least a part of exclusive data of the device written in the nonvolatile memory (103) through the connection circuit (104) and holds it. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009163843(A) 申请公布日期 2009.07.23
申请号 JP20080002309 申请日期 2008.01.09
申请人 PANASONIC CORP 发明人 NAKAO YOSHIAKI;GOHO YASUSHI;IWANARI SHUNICHI;MURAKUKI YASUO;MATSUURA MASANORI
分类号 G11C11/22;H01L21/8246;H01L27/10;H01L27/105 主分类号 G11C11/22
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