| 摘要 |
<p>Provided is a probe card wherein probe pins having horizontal cantilever shapes, respectively, can be used at the time of inspecting continuity of an integrated circuit wherein a plurality of electrodes are disposed in grid arrangement. A method for manufacturing such probe card is also provided. In a probe card (1), a plurality of probe pins (3) respectively brought into contact with a plurality of electrodes (11) provided in grid arrangement on an integrated circuit (10) are arranged on a wiring board (2). The probe pins (3) are formed in horizontal cantilever shapes, respectively, and the probe pins (3) are arranged by being tilted with respect to both directions in a two-dimensional direction (X direction and Y direction) in the grid arrangement of the electrodes (11).</p> |
