发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device capable of improving crystallinity in growing a plurality of semiconductor members made of group III nitride semiconductor. <P>SOLUTION: The method includes a process of forming a first buffer layer 30 on a base substrate 10, a process of making a mask 40 having a plurality of apertures on the first buffer layer 30, a second process of forming a plurality of second buffer layers 60a and 60b of group III nitride semiconductor on a plurality of regions exposed by the plurality of apertures on the first buffer layer 30, and a process of growing a plurality of semiconductor members of group III nitride semiconductor on the plurality of second buffer layers 60a and 60b. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009164611(A) |
申请公布日期 |
2009.07.23 |
申请号 |
JP20080335166 |
申请日期 |
2008.12.26 |
申请人 |
TOHOKU TECHNO ARCH CO LTD;FURUKAWA CO LTD;MITSUBISHI CHEMICALS CORP;DOWA HOLDINGS CO LTD;EPIVALLEY CO LTD;WAVESQUARE INC |
发明人 |
YAO TAKAFUMI;CHO MEOUNG WHAN |
分类号 |
H01L21/205;C23C16/01;C23C16/04;C23C16/34;C30B25/04;C30B29/38;H01L33/12;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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