发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE DEVICE, AND METHOD OF MANUFACTURING TRENCH GATE
摘要 <P>PROBLEM TO BE SOLVED: To provide an IGBT of a high resistance by suppressing physically carriers from being fluctuated below a trench gate. <P>SOLUTION: An IGBT 10 comprises an n<SP>+</SP>type emitter region 34, an n<SP>-</SP>type drift region 26, a (p) type body region 28 formed between the emitter region 34 and the drift region 26, a trench gate 40 extending in the body region 28 from the emitter region 34 toward the drift region 26, and an insulator protrusion 60. The protrusion 60 contacts the surface of the trench gate 40 at one end and protrudes at least partially into the drift region 26. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009164558(A) 申请公布日期 2009.07.23
申请号 JP20080156240 申请日期 2008.06.16
申请人 TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP 发明人 AOI SACHIKO;SUZUKI TAKASHI;SUGIYAMA TAKAHIDE;NISHIWAKI TAKESHI;SOENO AKITAKA
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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