发明名称 METHOD OF MANUFACTURING METAL WIRING OF SEMICONDUCTOR DEVICE
摘要 <p>A method for forming a metal line of a semiconductor device is provided to deposit effectively a metal layer for metal line within a wiring forming region including a contact hole and a trench. A plurality of insulating layers(104,106) equipped with contact holes are formed on the semiconductor substrate(100). A TiN layer is formed on an upper surface of the insulating layer including the surfaces of the contact holes. An anti-reflection layer is formed on an upper surface of the TiN layer. The anti-reflective layer, the TiN layer, and the insulating layers are etched to form a trench at an upper end part of the contact hole. The anti-reflective layer is removed. A metal layer is formed to bury the trench and the contact hole.</p>
申请公布号 KR20090079727(A) 申请公布日期 2009.07.22
申请号 KR20080005900 申请日期 2008.01.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HA, GA YOUNG;YOO, CHANG JUN
分类号 H01L21/28 主分类号 H01L21/28
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