发明名称 Method and system for inspecting surfaces with improved light efficiency
摘要 The radiation beam of discrete light source such as LEDs is shaped by a cylindrical lens and a spherical lens to form two perpendicular narrow lines to illuminate a surface. The first line is projected onto a sample surface to improve illumination efficiency, and the second line is projected onto a pupil plane of an imaging lens to improve illumination uniformity. The layout of the LED chip is optimized to match the aspect ratio of the imaging detector. Multiple LEDs at different wavelengths are combined to improve sensitivity. The full surface of the sample is inspected through the relative motion between the sample and the optics.
申请公布号 US7564544(B2) 申请公布日期 2009.07.21
申请号 US20070626102 申请日期 2007.01.23
申请人 3I SYSTEMS CORPORATION 发明人 ZHAO GUOHENG;YAN ZHENG;LI BO;CHEN WAYNE
分类号 G01N21/00;G03F1/84 主分类号 G01N21/00
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