发明名称 |
Jitter measuring apparatus, jitter measuring method and PLL circuit |
摘要 |
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
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申请公布号 |
US7564897(B2) |
申请公布日期 |
2009.07.21 |
申请号 |
US20040896751 |
申请日期 |
2004.07.22 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
ICHIYAMA KIYOTAKA;ISHIDA MASAHIRO;YAMAGUCHI TAKAHIRO;SOMA MANI |
分类号 |
H04B3/46 |
主分类号 |
H04B3/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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