发明名称 Jitter measuring apparatus, jitter measuring method and PLL circuit
摘要 A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
申请公布号 US7564897(B2) 申请公布日期 2009.07.21
申请号 US20040896751 申请日期 2004.07.22
申请人 ADVANTEST CORPORATION 发明人 ICHIYAMA KIYOTAKA;ISHIDA MASAHIRO;YAMAGUCHI TAKAHIRO;SOMA MANI
分类号 H04B3/46 主分类号 H04B3/46
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