发明名称 Method of fabricating a capacitor by using a metallic deposit in an interconnection dielectric layer of an integrated circuit
摘要 A manufacturing process for a capacitor in an interconnection layer includes the following stages: Deposit of a first metallic layer (21); Deposit of a first insulator layer (31) on the first metallic layer (21); Deposit of a second metallic layer (41) on the first insulator layer (31); Formation of an upper electrode (4) in the second layer metallic (41); Deposit of a second insulator layer (13) covering the upper electrode (4); Etching of the second insulator layer to form a spacer (14) on this first insulator layer surrounding the upper electrode (4); then Formation of a lower electrode (2) and a dielectric (3) by removal of parts from the first metallic layer and insulator not covered by the upper electrode (4) or the spacer (14); and Formation of an interconnection line (5). This process allows for manufacturing capacitors with an increased performance, in a simplified fashion at lower cost and with an auto-alignment.
申请公布号 US7563687(B2) 申请公布日期 2009.07.21
申请号 US20050302971 申请日期 2005.12.14
申请人 STMICROELECTRONICS S.A. 发明人 GIRAUDIN JEAN-CHRISTOPHE;CREMER SEBASTIEN;DELPECH PHILIPPE
分类号 H01L21/20 主分类号 H01L21/20
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