发明名称 |
TREATMENT METHOD FOR SURFACE OF SUBSTRATE, METHOD OF FABRICATING IMAGE SENSOR BY USING THE TREATMENT METHOD AND IMAGE SENSOR FABRICATED BY THE SAME |
摘要 |
A processing method of a substrate surface, an image sensor manufacturing method using the same, and an image sensor manufactured thereby are provided to improve a low illumination characteristic of an image sensor by removing defects of a surface of a substrate. A silicon substrate preparation process is performed to prepare a silicon substrate having a surface defect(S510). A chemical solution supply process is performed to supply a chemical solution for processing a surface of the silicon substrate(S520). A chemical oxide layer manufacturing process is performed to consume the surface of the silicon substrate and to manufacture a chemical oxide layer on the silicon substrate(S530). A surface defect removal process is performed to remove defects from the surface of the silicon substrate.
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申请公布号 |
KR20090079107(A) |
申请公布日期 |
2009.07.21 |
申请号 |
KR20080005079 |
申请日期 |
2008.01.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, GI BUM;NOH, HYUN PIL |
分类号 |
H01L21/306;H01L27/146 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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