发明名称 Chip and wafer integration process using vertical connections
摘要 A metallized feature is formed in the top surface of a substrate, and a handling plate is attached to the substrate. The substrate is then thinned at the bottom surface thereof to expose the bottom of the feature, to form a conducting through-via. The substrate may comprise a chip having a device (e.g. DRAM) fabricated therein. The process therefore permits vertical integration with a second chip (e.g. a PE chip). The plate may be a wafer attached to the substrate using a vertical stud/via interconnection. The substrate and plate may each have devices fabricated therein, so that the process provides vertical wafer-level integration of the devices.
申请公布号 US7564118(B2) 申请公布日期 2009.07.21
申请号 US20080114145 申请日期 2008.05.02
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 POGGE H. BERNHARD;YU ROY;PRASAD CHANDRIKA;NARAYAN CHANDRASEKHAR
分类号 H01L23/12;H01L29/40;H01L21/44;H01L21/68;H01L21/768;H01L23/48;H01L23/485;H01L23/52;H01L23/525;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L23/12
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