Thermal fly height induced shield instability screening for magnetoresistive heads

摘要

A method for testing magnetic heads formed on a wafer to detect the presence of thermal induced popcorn noise resulting from thermal fly height control. The method includes performing a quasi test on a magnetic head, the quasi test being performed over 400 or more cycles of magnetic field application. For additional test accuracy, the write head can be cycled while 400 or more cycles of magnetic field are generated.