发明名称 PROTECTIVE TAPE CUTTING METHOD FOR SEMICONDUCTOR WAFER AND DEVICE OF THE SAME
摘要 <p>A method for cutting a protective tape of a semiconductor wafer and an apparatus thereof are provided to cut a protective tape while removing dust generated by a tape cutting. A cutter blade(12) is moved according to a circumference of a semiconductor wafer. Dust is generated in a tape cutting part by a cutter blade, and is attached on a top surface of a protective tape. A dust collection member(56) is moved together with the cutter blade, and collects the dust. After finishing a tape cutting, the dust collected in a fixed part of the dust collection member is absorbed and is removed in an absorption device. The dust collection member is a brush. The brush collects the dust. While the brush is separated from the semiconductor wafer, an air blow is performed toward the brush and the dust from an air nozzle.</p>
申请公布号 KR20090054908(A) 申请公布日期 2009.06.01
申请号 KR20080117783 申请日期 2008.11.26
申请人 NITTO DENKO CORPORATION 发明人 ISHII NAOKI;YAMAMOTO MASAYUKI
分类号 H01L21/304;H01L21/68 主分类号 H01L21/304
代理机构 代理人
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