发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of continuously performing desired image processing even if the number of the pixels of image data is changed over by selecting whether binning processing is performed. SOLUTION: The X-ray inspection device 1 includes a standard image data forming part 31 for forming standard image data, a veining processing control part 32 for forming binning image data showing an image composed of a plurality of block pixels, an image data determination part 35 for determining the formation of either one of the standard image data or binning image data and a convolution filtering processing control part 36 for executing desired image processing using a convolution filter. The convolution filtering processing control part 36 performs the changeover to the convolution filter for the standard image data by accompanying the determination of the formation of the standard image data in the image data determination part 35 while performing the changeover to the convolution filter for the binning image data by accompanying the formation of the binning image data. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009079949(A) 申请公布日期 2009.04.16
申请号 JP20070248339 申请日期 2007.09.26
申请人 SHIMADZU CORP 发明人 KUSHIBIKI TAKATSUGU
分类号 G01N23/04;G06T1/00 主分类号 G01N23/04
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