发明名称 CVD METHOD FOR FORMING SILICON NITRIDE FILM
摘要 A CVD method for forming a silicon nitride film comprises a step wherein while exhausting air from a process chamber (8) in which a substrate (W) to be processed is placed, a silane gas (HCD) and ammonia gas (NH3) are supplied into the chamber and a silicon nitride film is formed on the substrate by CVD. This silicon nitride film-forming step comprises a first period during when the silane gas (HCD) is supplied into the process chamber and a second period during when the supply of the silane gas is suspended, and the first period alternates with the second period.
申请公布号 KR20090037984(A) 申请公布日期 2009.04.16
申请号 KR20097006939 申请日期 2004.05.21
申请人 TOKYO ELECTRON LIMITED 发明人 KATO HITOSHI;FUKUSHIMA KOHEI;YONEZAWA MASATO;HIRAGA JUNYA
分类号 H01L21/205;C23C14/24;C23C16/34;C23C16/44;C23C16/455;H01L21/318 主分类号 H01L21/205
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