发明名称 |
CVD METHOD FOR FORMING SILICON NITRIDE FILM |
摘要 |
A CVD method for forming a silicon nitride film comprises a step wherein while exhausting air from a process chamber (8) in which a substrate (W) to be processed is placed, a silane gas (HCD) and ammonia gas (NH3) are supplied into the chamber and a silicon nitride film is formed on the substrate by CVD. This silicon nitride film-forming step comprises a first period during when the silane gas (HCD) is supplied into the process chamber and a second period during when the supply of the silane gas is suspended, and the first period alternates with the second period.
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申请公布号 |
KR20090037984(A) |
申请公布日期 |
2009.04.16 |
申请号 |
KR20097006939 |
申请日期 |
2004.05.21 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
KATO HITOSHI;FUKUSHIMA KOHEI;YONEZAWA MASATO;HIRAGA JUNYA |
分类号 |
H01L21/205;C23C14/24;C23C16/34;C23C16/44;C23C16/455;H01L21/318 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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