发明名称 |
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION IN INTEGRATED CIRCUIT TESTING |
摘要 |
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
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申请公布号 |
WO2008081419(A3) |
申请公布日期 |
2009.04.16 |
申请号 |
WO2006IL01501 |
申请日期 |
2006.12.28 |
申请人 |
OPTIMALTEST LTD.;BALOG, GIL;LINDE, REED;GOLAN, AVI |
发明人 |
BALOG, GIL;LINDE, REED;GOLAN, AVI |
分类号 |
G01R31/00;G01R31/14;G01R31/26;G06F19/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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