发明名称 NANOPARTICLE MEASURING METHOD OF AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and device measuring a diffusion coefficient or a particle size of nanoparticles with greatly higher sensitivity and an excellent S/N ratio in comparison with a dynamic scattering method, and also measuring particles comparatively simply even in the case of the particles not generating or hardly generating dielectrophoresis or electrophoresis. SOLUTION: A magnetic field having a spatial period is formed in a sample formed by dispersing movably a particle group to be measured into a medium, to thereby subject the particle group to magnetophoresis, and a diffraction grating by a density distribution of the particle group in the medium is generated, and diffracted light generated by irradiating the diffraction grating with a parallel light flux from an irradiation optical system 4 is measured by a detection optical system 5, and information on the diffusion coefficient of the particle group to be measured is acquired from a change with time of diffracted light intensity from the point of time when formation of the magnetic field is stopped. The magnetic field having the spatial period is formed, for example, by sending a current from a current source 3 into a magnetic field formation circuit 2 having a plurality of parallel parts 2a. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009079919(A) 申请公布日期 2009.04.16
申请号 JP20070247403 申请日期 2007.09.25
申请人 SHIMADZU CORP 发明人 TOTOKI SHINICHIRO
分类号 G01N15/02 主分类号 G01N15/02
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