发明名称 |
System and Method to Determine Chromatic Dispersion in Short Lengths of Waveguides Using a Common Path Interferometer |
摘要 |
The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a two wave interference pattern and a common path interferometer. Specifically the invention comprises a radiation source operable to emit radiation connected to a means for separating incident and reflected waves; the means for separating incident and reflected waves possessing an output arm adjacent to a first end of the waveguide; and the means for separating incident and reflected waves further connected to an optical detector operable to record an interference pattern generated by a reflected test emission from the radiation source. The interference pattern consists of two waves: one reflected from a first facet of a waveguide and the second reflected from a second facet of the same waveguide.
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申请公布号 |
US2009097036(A1) |
申请公布日期 |
2009.04.16 |
申请号 |
US20070872395 |
申请日期 |
2007.10.15 |
申请人 |
GALLE MICHAEL;MOHAMMED WALEED;QIAN LI |
发明人 |
GALLE MICHAEL;MOHAMMED WALEED;QIAN LI |
分类号 |
G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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