发明名称 Systems and Methods for Measuring the Electrical Properties of a Microparticle
摘要 A method of measuring the electrical properties of a microparticle is provided, which can include multiple steps. Steps can include situating the microparticle within an array of electrodes submerged in a conductive medium so that the microparticle and electrodes are in electrical communication when the electrodes are energized, and delivering an electrical signal into the medium from one electrode to an immediately adjacent electrode. High frequency signals can be used to penetrate the microparticle boundary and characterize the same, and low frequency signals can be used to characterize the shape and orientation of the microparticle. Characterization can be carried out by measuring the impedance affecting the current using at least one of a remaining electrode in the array.
申请公布号 US2009096470(A1) 申请公布日期 2009.04.16
申请号 US20080249643 申请日期 2008.10.10
申请人 RABBITT RICHARD D;DHARIA SAMEERA 发明人 RABBITT RICHARD D.;DHARIA SAMEERA
分类号 G01N27/02 主分类号 G01N27/02
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