| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reliably determining a faulty chip before being broken. SOLUTION: The semiconductor device 100 has: an internal circuit 2 to which a power supply voltage for a burn-in test is supplied; a voltage level detector 13 for detecting a voltage variation in the internal circuit 2 to generate a detection signal based on a detection result concerned; a fuse 9 which is blown out based on the detection signal; and a switching circuit 19 for shutting off the supply of a power supply voltage for the burn-in test to the internal circuit 2 based on the detection signal. A voltage variation in the internal circuit 2 to which the power supply voltage for the burn-in test is supplied is detected to generate the detection signal based on the detection result concerned, whereby the fuse 9 is blown out and the supply of the power supply voltage for the burn-in test to the internal circuit 2 is shut off. COPYRIGHT: (C)2009,JPO&INPIT
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