| 摘要 |
A head test apparatus includes a loading section that installs the head; a head operation section that causes the head installed in the loading section to execute a test access; a test section that examines the head by judging whether a test access signal obtained from the head when the test access is executed satisfies a predetermined reference; a signal output section that obtains the test access signal and outputs the obtained test access signal to an exterior of the head test apparatus; and a reference output section that outputs a reference signal which is used for taking, in the exterior of the head test apparatus, the test access signal that the signal output section outputs in synchronism with an acquisition of the head test access.
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